Pattern Classification, 2nd Edition, 9780471056690
Hardcover
Unlock patterns: Neural nets, machine learning, and statistical mastery await.

Pattern Classification, 2nd Edition

$300.80

  • Hardcover

    688 pages

  • Release Date

    25 October 2000

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Summary

Pattern Classification: A Modern Classic

The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics.

Book Details

ISBN-13:9780471056690
ISBN-10:0471056693
Author:Richard O. Duda, David G. Stork, Peter E. Hart
Publisher:John Wiley & Sons Inc
Imprint:Wiley-Interscience
Format:Hardcover
Number of Pages:688
Edition:2nd
Release Date:25 October 2000
Weight:1.23kg
Dimensions:257mm x 185mm x 38mm
What They're Saying

Critics Review

”…it provides a good introduction to the subject of Pattern Classification.” (Journal of Classification, September 2007) “…a fantastic book! The presentation…could not be better, and I recommend that future authors consider…this book as a role model.” (Journal of Statistical Computation and Simulation, March 2006) “…strongly recommended both as a professional reference and as a text for students…” (Technometrics, February 2002) “…provides information needed to choose the most appropriate of the many available technique for a given class of problems.” (SciTech Book News, Vol. 25, No. 2, June 2001) “I do not believe anybody wishing to teach or do serious work on Pattern Recognition can ignore this book, as it is the sort of book one wishes to find the time to read from cover to cover!” (Pattern Analysis & Applications Journal, 2001) “This book is the unique text/professional reference for any serious student or worker in the field of pattern recognition.” (Mathematical Reviews, Issue 2001k) “…gives a systematic overview about the major topics in pattern recognition, based whenever possible on fundamental principles.” (Zentralblatt MATH, Vol. 968, 2001⁄18) “attractively presented and readable” (Journal of Classification, Vol.18, No.2 2001)

About The Author

Richard O. Duda

RICHARD O. DUDA, PhD, is Professor in the Electrical Engineering Department at San Jose State University, San Jose, California.

PETER E. HART, PhD, is Chief Executive Officer and President of Ricoh Innovations, Inc. in Menlo Park, California.

DAVID G. STORK, PhD, is Chief Scientist, also at Ricoh Innovations, Inc.

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