
Hardcover
Offers an overview of applications for selected electron microscope techniques that have become widespread in their use for furthering our understanding of how materials behave. This work discusses topics including weak-beam techniques for problem solving, defect structures and dislocation interacti…
Topics in Electron Diffraction and Microscopy of Materials, 1st Edition
$558.87
- Hardcover
208 pages
- Release Date
1 January 1999
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Summary
Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today’s heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.The book provides a useful overview of current applications f…
Book Details
| ISBN-13: | 9780750305389 |
|---|---|
| ISBN-10: | 075030538X |
| Series: | Series in Microscopy in Materials Science |
| Author: | Peter. B. Hirsch |
| Publisher: | Taylor & Francis Ltd |
| Imprint: | Institute of Physics Publishing |
| Format: | Hardcover |
| Number of Pages: | 208 |
| Edition: | 1st |
| Release Date: | 1 January 1999 |
| Weight: | 317g |
| Dimensions: | 234mm x 156mm |
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About The Author
Peter. B. Hirsch
Peter. B Hirsch
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