Applied Reliability, 3rd Edition
$94.39
- Paperback
600 pages
- Release Date
14 October 2024
Summary
Since the publication of the second edition of Applied Reliability in 1995, the ready availability of inexpensive, powerful statistical software has changed the way statisticians and engineers look at and analyze all kinds of data. Problems in reliability that were once difficult and time consuming even for experts can now be solved with a few well-chosen clicks of a mouse. However, software documentation has had difficulty keeping up with the enhanced functionality added to …
Book Details
| ISBN-13: | 9781032918334 |
|---|---|
| ISBN-10: | 1032918330 |
| Author: | Paul A. Tobias, David Trindade |
| Publisher: | Taylor & Francis Ltd |
| Imprint: | Chapman & Hall/CRC |
| Format: | Paperback |
| Number of Pages: | 600 |
| Edition: | 3rd |
| Release Date: | 14 October 2024 |
| Weight: | 1.11kg |
| Dimensions: | 178mm x 254mm |
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Critics Review
“I have used the second edition of this book for an Introduction to Reliability course for over 15 years. … The third edition … retains the features I liked about the second edition. In addition, it includes improved graphics … [and] examples of popular software used in industry … There is a new chapter on Bayesian reliability and additional material on reliability data plotting, and repairable systems’ analysis. … The book does a good and comprehensive job of explaining the basic reliability concepts; types of data encountered in practice and how to treat this data; reliability data plotting; and the common probability distributions used in reliability work, including motivations for their use and practical areas of application. … an excellent choice for a first course in reliability. The book also does a good job of explaining more advanced topics … the book will continue to be a popular desk reference in industry and a textbook for advanced undergraduate or first-year graduate students.”
—Journal of the American Statistical Association, June 2014
Paul A. Tobias
Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society’s Lifetime Achievement Award.
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