Advances in Info-Metrics, 9780190636685
Hardcover
Solve problems with noisy data: Inference from information and uncertainty.

Advances in Info-Metrics

information and information processing across disciplines

$560.60

  • Hardcover

    560 pages

  • Release Date

    4 November 2020

Check Delivery Options

Summary

Navigating Uncertainty: Advances in Info-Metrics

Info-metrics provides a framework for modeling, reasoning, and drawing inferences when information is noisy and insufficient. It is an interdisciplinary approach intersecting information theory, statistical inference, and decision-making under uncertainty.

In Advances in Info-Metrics, Min Chen, J. Michael Dunn, Amos Golan, and Aman Ullah assemble thirty experts to broaden the study of info-metrics across various scien…

Book Details

ISBN-13:9780190636685
ISBN-10:0190636688
Author:Min Chen, J. Michael Dunn, Amos Golan, Aman Ullah
Publisher:Oxford University Press Inc
Imprint:Oxford University Press Inc
Format:Hardcover
Number of Pages:560
Release Date:4 November 2020
Weight:1.09kg
Dimensions:168mm x 249mm x 33mm
What They're Saying

Critics Review

“The book should be of interest to researchers and practitioners who need to present convincing conclusions, and would make a good addition to libraries supporting advanced studies in computer and information sciences.” – R. Bharath, emeritus, Northern Michigan University, CHOICE”Information permeates every corner of our lives and shapes our universe. Advances in Info-Metrics expands the study of info-metrics and provides a framework for modeling, reasoning, and drawing inferences across disciplines. It explores philosophical and mathematical foundations of information. It also demonstrates how to solve problems through many cross-disciplinary examples arising in biology, medicine, economy, and data science.” – WojciechSzpankowski, Saul Rosen Professor of Computer Science, Purdue University”This volume has emerged from the Info-metrics Institute, set up by one of the authors, Professor Golan, over a decade ago. The Institute has since done much to stimulate research in a broad area of theoretical and empirical statistics. The present volume, consisting of many and varied research papers, should certainly be valuable in stimulating further research.” – Peter M. Robinson, Tooke Emeritus Professor of Economic Science and Statistics, London Schoolof Economics”Impressive contributions in this volume address many aspects of information theory concepts, measures, and applications. It is a multidisciplinary tour de force, covering foundations, inference, and applications to finance, computing, behavioral models, and much more.” – Esfandiar Maasoumi, Arts & Sciences Distinguished Professor, Emory University

About The Author

Min Chen

Min Chen is the Professor of Scientific Visualization at Oxford University and a fellow of Pembroke College. He has co-authored over 200 publications, including his recent contributions in areas such as theory of visualization, video visualization, visual analytics, and perception and cognition in visualization.

J. Michael Dunn is Oscar Ewing Professor Emeritus of Philosophy, Professor Emeritus of Informatics and Computer Science, at Indiana University, where he spent most of his career and was founding dean of the School of Informatics. He is an affiliate member of the Info-Metrics Institute at the American University. His research has focused on information based logics.

Amos Golan is Professor of Economics and Director of the Info-Metrics Institute at American University. He is also an External Professor at the Santa Fe Institute and a Senior Associate at Pembroke College, Oxford. A leader in info-metrics, he is the author of Foundations of Info-Metrics: Information, Inference, and Incomplete Information.

Aman Ullah is Distinguished Professor of Economics at the University of California, Riverside. The author of 10 books and more than 160 published articles, Professor Ullah has helped shape the field of econometrics and has pioneered the development and application of non-parametric and semi-parametric methods.

Returns

This item is eligible for free returns within 30 days of delivery. See our returns policy for further details.