Analysis Methods for RF, Microwave, and Millimeter-Wave Planar Transmission Line Structures, 9780471017509
Hardcover
Introducing several important and useful methods for analyzing planar transmission line structures, this text discusses such topics as the theory and applications of Green’s functions, the conformal mapping method, spectral domain methods, variational methods.

Analysis Methods for RF, Microwave, and Millimeter-Wave Planar Transmission Line Structures

$413.11

  • Hardcover

    256 pages

  • Release Date

    19 July 2000

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Summary

A one-stop reference to the major techniques for analyzing microwave planar transmission line structures The last two decades have seen important progress in the development of methods for the analysis of microwave and millimeter-wave passive structures, which contributed greatly to microwave integrated circuit design while also stimulating the development of new planar transmission lines. This timely and authoritative work introduces microwave engineers to the most commonly used techniques …

Book Details

ISBN-13:9780471017509
ISBN-10:0471017507
Series:Wiley Series in Microwave and Optical Engineering
Author:Cam Nguyen
Publisher:John Wiley & Sons Inc
Imprint:Wiley-Interscience
Format:Hardcover
Number of Pages:256
Edition:1st
Release Date:19 July 2000
Weight:485g
Dimensions:243mm x 162mm x 17mm
What They're Saying

Critics Review

”…this book introduces the most commonly used techniques for analyzing microwave planar transmission live structures.” (SciTech Book News, Vol. 25, No. 2, June 2001) “All important fundamental concepts and principles are covered as far as is possible with in a text of reasonable size…addresses student of electromagnetic theory…also…the engineer who is need of knowledge and practical, easy-to-apply formulas for the various line systems.” (Measurement Science & Technology, Vol. 12, No. 10, October 2001) “…covers the analysis methods…from basics to advanced levels. All important fundamental concepts and principles are covered as far as is possible within a text of reasonable size.” (Measurement Science & Technology, Vol. 12, No. 10, October 2001)

About The Author

Cam Nguyen

CAM NGUYEN, PhD, is a professor in the Department of Electrical Engineering at Texas A&M University.

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