Statistical Pattern Recognition
$336.55
- Hardcover
672 pages
- Release Date
7 November 2011
Summary
Mastering Statistical Pattern Recognition: Techniques and Applications
Statistical pattern recognition utilizes statistical methods to analyze data measurements for information extraction and informed decision-making. It’s a dynamic field with recent advancements impacting data mining, web searching, multimedia retrieval, face recognition, and handwriting recognition, all demanding robust pattern recognition.
This third edition introduces statistical pattern theory and techn…
Book Details
| ISBN-13: | 9780470682272 |
|---|---|
| ISBN-10: | 0470682272 |
| Author: | Andrew R. Webb, Keith D. Copsey |
| Publisher: | John Wiley & Sons Inc |
| Imprint: | John Wiley & Sons Inc |
| Format: | Hardcover |
| Number of Pages: | 672 |
| Edition: | 3rd |
| Release Date: | 7 November 2011 |
| Weight: | 1.23kg |
| Dimensions: | 249mm x 175mm x 41mm |
What They're Saying
Critics Review
“In the end I must add that this book is so appealing that I often found myself lost in the reading, pausing the overview of the manuscript in order to look more into some presented subject, and not being able to continue until I had finished seeing all about it.” (Zentralblatt MATH, 1 December 2012)
About The Author
Andrew R. Webb
Dr Andrew Robert Webb, Senior Researcher, QinetiQ Ltd, Malvern, UK.
Dr Keith Derek Copsey, Senior Researcher, QinetiQ Ltd, Malvern, UK.
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